Circuit Reliability: Mechanisms, Monitors, and Effects in Near-Threshold Processors
Chris Kim
Associate Professor, University of Minnesota
Professor Chris H. Kim received his B.S. degree in electrical engineering and his M.S. degree in biomedical engineering from Seoul National University, Seoul, Korea. He received the Ph.D. degree in electrical and computer engineering from Purdue University, West Lafayette, Indiana, USA. He spent a year at Intel Corporation where he performed research on variation-tolerant circuits, on-die leakage sensor design and crosstalk noise analysis. He joined the electrical and computer engineering faculty at University of Minnesota, Minneapolis, MN, in 2004.
Prof. Kim is the recipient of the NSF CAREER Award, Mcknight Foundation Land-Grant Professorship, 3M Non-Tenured Faculty Award, DAC/ISSCC Student Design Contest Awards, IBM Faculty Partnership Awards, IEEE Circuits and Systems Society Outstanding Young Author Award, ISLPED Low Power Design Contest Awards, Intel Ph.D. Fellowship, and Magoon's Award for Excellence in Teaching. He is an author/coauthor of 100+ journal and conference papers and has served as a technical program committee member for numerous circuit design conferences. His current research interests include digital, mixed-signal, and memory circuit design for silicon and non-silicon (flextronics and spintronics) technologies.
